Speaker: Dr. Michael Paukshto, Stanford University
Title: Optical Characterization of Display Materials
Abstract: A systematic approach to analyze and optimize display characteristics requires the data on dielectric tensors and geometrical parameters of the display optical components such as transparent conductors, compensation layers, polarizers, liquid crystals, etc. Some of these parameters can be evaluated from reflective and transmissive measurements of single isotropic or anisotropic layers. Other parameters can be extracted from the measurements of multilayer structures. Thus, the generalized spectroscopic ellipsometry and Mueller-matrix measurements were successfully applied to LCD displays without color filters to define the liquid crystal dielectric tensor. The presence of color filter array in LC cell may cause an additional light scattering and depolarization, which substantially reduces the quality of spectroscopic data and therefore the method’s precision. In this regard the Mueller-matrix imaging polarimetry, which simultaneously measure and angularly resolve reflection and transmission over large solid angles, was used. A technical review of different methods and instruments for characterization of optical materials will be presented. Also we present new software for characterization of anisotropic multilayer structures and discuss limitations of extended Jones method and related Mueller-matrix approach for characterization of thin anisotropic coating. Several examples of the characterization of new transparent conductors based on metal nanowires and carbon nanotubes coatings will be presented as well. The real time software demonstration is available.
Speaker Background: Michael V. Paukshto received a Ph. D. in mathematical physics and a Dr. Sc. in theoretical physics and applied engineering from St.-Petersburg State University. From 1994 to 1998 he was a professor at St.-Petersburg University, as well as a visiting research scientist at the NSF Institute for Mechanics and Materials at the University of California, San Diego. In 1998 he joined Quanta Vision, Inc. and was working at Stanford Medical Center in the area of x-ray characterization of human tissue. From 2000 to 2005 he served as a senior scientist and then a chief optical designer, at Optiva, Inc. in South San Francisco. Since March 2005, he is a consulting professor at Stanford University working as a principal investigator in several projects in the areas of new display materials, metal nanowires and carbon nanotubes optical coating, diffraction grating, and biotechnology. He has more than 100 scientific publications and more than 35 patents and patent applications. He co-founded Sheartek, LLC and currently serves as Chief Technical Officer.
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