Presentation Abstract

​In July, 2021, SID’s International Committee for Display Metrology (ICDM) announced an update to the Information Display Measurements Standard (IDMS), which is the display industry’s bible for display measurement and characterization. The update is called IDMS v1.1, and it is the first major update to the IDMS in over nine years. Over 250 pages of new content covers areas such as color capability characterization, high dynamic range displays, new temporal methods, and more than 100 pages on evaluation methods of near-eye displays for AR and VR. Prior content from v1.0 has also been expanded in many areas such as 3D methods, notably for light field displays, extension of the reflection chapter to include transmissive displays, spatial performance updates, and several other improvements. The update is both commercially and scientifically significant. This talk will take a look inside the newly-released IDMS, explaining how the new version addresses the needs of modern displays using the latest metrology methods.

IDMS v1.1 is available as a free download at the following link:
https://www.sid.org/Standards/ICDM#8271483-idms-download

Brian Berkeley

Brian Berkeley received S.B. and M.S. degrees in electrical engineering from M.I.T. and Carnegie-Mellon University, respectively. He had a 20-year career at Apple Inc., starting as display engineer on the first Macintosh. He put color on the Macintosh, led all Apple display development, and led hardware development for the first iMac computer. In 2003, he took on a role as VP of Engineering at Samsung Display in South Korea. In his 8 years in Korea, he had major successes in LCD and OLED research and panel development. In early 2012, he moved back to Silicon Valley to start up Samsung Display’s USA laboratory, which he led for three years. Since 2015, he has been an industry consultant as Principal for Highlight Display, LLC. Mr. Berkeley has over 50 display industry publications with over 750 citations. He has been an SID member for over 30 years and has served on the SID Program Committee for over 25 years. He served as the SID Symposium Technical Program Chair (2000) and General Chair (2002), and served on the SID Executive Board for 10 years (2006-2016), including two years as SID’s President (2012-2014). He helped rebuild SID during a critical transition period. He was awarded SID Fellow in 2012 and has received six Presidential Citations for his service to SID. He currently remains active with SID on its Program Committee, the Display Industry Awards Committee, and as an Executive Committee member of SID’s International Committee for Display Metrology (ICDM).